1932

Abstract

Leaf rust (caused by f. sp. ) is the most widespread and regularly occurring rust on wheat. Genetic resistance is the most economical method of reducing yield losses due to leaf rust. To date, 46 leaf rust resistance genes have been designated and mapped in wheat. Resistance gene expression is dependent on the genetics of host-parasite interaction, temperature conditions, plant developmental stage, and interaction between resistance genes with suppressors or other resistance genes in the wheat genomes. Genes expressed in seedling plants have not provided long-lasting effective leaf rust resistance. Adult-plant resistance genes and singly and together have provided the most durable resistance to leaf rust in wheat throughout the world. Continued efforts to isolate, characterize, and map leaf rust resistance genes is essential given the ability of the leaf rust fungus to overcome deployed resistance genes.

Loading

Article metrics loading...

/content/journals/10.1146/annurev.phyto.34.1.435
1996-09-01
2024-06-17
Loading full text...

Full text loading...

/content/journals/10.1146/annurev.phyto.34.1.435
Loading
/content/journals/10.1146/annurev.phyto.34.1.435
Loading

Data & Media loading...

  • Article Type: Review Article
This is a required field
Please enter a valid email address
Approval was a Success
Invalid data
An Error Occurred
Approval was partially successful, following selected items could not be processed due to error