1932

Abstract

The electrostatic force microscope is one of many specialized tip sensors used in near-field microscopy. This type of microscope is realized by applying a voltage on a conducting AFM tip. It can be used to image samples that present a distribution of electrical properties on inhomogeneous materials as well as on nanostructures. This microscopy technique has been used to probe phase separation, chemical recognition, molecular orientation, and photo-induced charge separation in molecular photodiodes in Langmuir-Blodgett films.

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/content/journals/10.1146/annurev.matsci.29.1.353
1999-08-01
2024-04-19
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  • Article Type: Review Article
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