1932

Abstract

Abstract

The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed.

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/content/journals/10.1146/annurev.matsci.37.052506.084401
2007-08-04
2024-06-19
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  • Article Type: Review Article
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