1932

Annual Review of Materials Research

Volume 26,

Review Article

Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces and Carrier Transport

L D Bell, and W J Kaiser
Vol. 26:189-222 (Volume publication date August 1996) https://doi.org/10.1146/annurev.ms.26.080196.001201
© Annual Reviews

There is no abstract available.

Article metrics loading...

/content/journals/10.1146/annurev.ms.26.080196.001201

1996-08-01

2024-12-01

Loading full text...

Full text loading...

/content/journals/10.1146/annurev.ms.26.080196.001201

Article Type: Review Article

Most Cited Most Cited RSS feed

- SOFT LITHOGRAPHY
  
  Younan Xia, and George M. Whitesides
  
  Vol. 28 (1998), pp. 153–184
- Synthesis and Characterization of Monodisperse Nanocrystals and Close-Packed Nanocrystal Assemblies
  
  C. B. Murray, C. R. Kagan, and M. G. Bawendi
  
  Vol. 30 (2000), pp. 545–610
- Phase-Field Models for Microstructure Evolution
  
  Long-Qing Chen
  
  Vol. 32 (2002), pp. 113–140
- THE MATERIAL BONE: Structure-Mechanical Function Relations
  
  S. Weiner, and H. D. Wagner
  
  Vol. 28 (1998), pp. 271–298
- Wetting and Roughness
  
  David Quéré
  
  Vol. 38 (2008), pp. 71–99
- Proton-Conducting Oxides
  
  K.D. Kreuer
  
  Vol. 33 (2003), pp. 333–359
- High Rate Thick Film Growth
  
  J A Thornton
  
  Vol. 7 (1977), pp. 239–260
- Inkjet Printing of Functional and Structural Materials: Fluid Property Requirements, Feature Stability, and Resolution
  
  Brian Derby
  
  Vol. 40 (2010), pp. 395–414
- Mussel-Inspired Adhesives and Coatings
  
  Bruce P. Lee, P.B. Messersmith, J.N. Israelachvili, and J.H. Waite
  
  Vol. 41 (2011), pp. 99–132
- Strongly Geometrically Frustrated Magnets
  
  A P Ramirez
  
  Vol. 24 (1994), pp. 453–480
More Less

This is a required field

Please enter a valid email address

Approval was a Success

Invalid data

An Error Occurred

Approval was partially successful, following selected items could not be processed due to error